Fig. 1From: The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO2-Based RRAM and Applications for Pattern Recognition a Microscope image of the fabricated 8āĆā16 Al2O3/HfO2-based crossbar RRAM array. b The structure of RRAM cell. c The fabrication process flow. d Typical IāV curve measured in the RRAM cellsBack to article page