Electronic Structure and Charge-Trapping Characteristics of the Al2O3-TiAlO-SiO2 Gate Stack for Nonvolatile Memory Applications

Xu, Wenchao; Zhang, Yang; Tang, Zhenjie; Shao, Zhengjie; Zhou, Guofu; Qin, Minghui; Zeng, Min; Wu, Sujuan; Zhang, Zhang; Gao, Jinwei; Lu, Xubing; Liu, Junming

doi:10.1186/s11671-017-2040-x

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Electronic Structure and Charge-Trapping Characteristics of the Al₂O₃-TiAlO-SiO₂ Gate Stack for Nonvolatile Memory Applications

Last updated: Tue, 16 Apr 2024 11:22:28 UTC

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