Skip to main content
Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Engineering the Complex-Valued Constitutive Parameters of Metamaterials for Perfect Absorption

Fig. 3

a The necessary refractive index n 1 and b extinction coefficient k 1 of the anti-reflection layer as a function of light wavelength and thickness d 1 for achieving perfect absorption. The wavelength is varied from 300 to 800 nm. The thickness d 1 of the anti-reflection layer is increased from 10 to 30 nm in steps of 2 nm. The thickness of the α-Si:H layer d 2 = 15 nm. c, d The same as with a and b, but for thickness d 2 increased from 10 to 30 nm, and d 1 = 15 nm. The black lines in a and c indicate the boundaries at which the refractive index n 1 is equal to zero

Back to article page