Fig. 4From: Infrared, Raman and Magnetic Resonance Spectroscopic Study of SiO2:C NanopowdersThe temperature behavior of X-band CW EPR spectra measured in initial SiO2:C (a) and SiO2:C samples annealed at 500 °C (b), 700 °C (c), and 800 °C (d)Back to article page