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Table 1 Surface treatment and high-κ dielectric growth condition by PEALD

From: AlN Surface Passivation of GaN-Based High Electron Mobility Transistors by Plasma-Enhanced Atomic Layer Deposition

Condition

TMA

 

2800 W

N2 Plasma

(Ar: 160 sccm)

2800 W

NH3 Plasma

(Ar: 110 sccm)

1500 W

H2 Plasma

(Ar: 30 sccm)

1500 W

NH3 Plasma

(Ar: 30 sccm)

Cycles

Flow

Pulse/purge

Flow

Pulse/purge

Flow

Pulse/purge

Flow

Pulse/purge

Flow

Pulse/purge

Pre-treatment (300 °C)

      

15

5/5

50

5/5

36

N2-based AlN (350oC)

150

0.1/5

40

5.5/8

      

45

NH3-based AlN (300 °C)

150

0.1/5

  

80

11.5/8

    

19

Unit:

(sccm)

(s)

(sccm)

(s)

(sccm)

(s)

(sccm)

(s)

(sccm)

(s)

cyls

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