Fig. 3From: Band Offset Measurements in Atomic-Layer-Deposited Al2O3/Zn0.8Al0.2O Heterojunction Studied by X-ray Photoelectron SpectroscopyXPS spectra for a survey scan, b Zn 2p 3/2, c Zn 2p 1/2, and d VBM of Zn0.8Al0.2O and e survey scan, f Al 2p, g O 1s, and h VBM of Al2O3, with application of a low-energy electron flood gunBack to article page