Fig. 4From: Band Offset Measurements in Atomic-Layer-Deposited Al2O3/Zn0.8Al0.2O Heterojunction Studied by X-ray Photoelectron SpectroscopyCLs of Al2O3/Zn0.8Al0.2O samples with varied Al2O3 thickness a–d 3 nm, e–h 4 nm, and i–l 5 nm, with application of a low-energy electron flood gunBack to article page