Fig. 6From: Band Offset Measurements in Atomic-Layer-Deposited Al2O3/Zn0.8Al0.2O Heterojunction Studied by X-ray Photoelectron SpectroscopyAl 2p (a), Zn 2p 1/2 (b), and Zn 2p 3/2 (c), CL binding energies as a function of the Al2O3 thin film thicknessBack to article page