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Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Effect of Systematic Control of Pd Thickness and Annealing Temperature on the Fabrication and Evolution of Palladium Nanostructures on Si (111) via the Solid State Dewetting

Fig. 3

ac Energy-dispersive X-ray spectroscopy (EDS) spectra of the samples with various Pd deposition amount between 0.5 and 100 nm after annealing at 575 °C for 450 s. Raman summary plots of d peak counts (PC), e peak position (PP), and f full width at half maximum (FWHM) as function of deposition amount between 0.5 and 100 nm. The full-range Raman spectra are shown in Additional file 1: Figure S6

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