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Fig. 5 | Nanoscale Research Letters

Fig. 5

From: Effect of Systematic Control of Pd Thickness and Annealing Temperature on the Fabrication and Evolution of Palladium Nanostructures on Si (111) via the Solid State Dewetting

Fig. 5

Effect of the annealing temperature (AT) between 450 and 700 °C on the evolution of self-assembled Pd NPs with constant deposition amount of 5 nm annealed for 450 s. a–f AFM top-views of Pd NPs with the area of 3 × 3 μm2, in which the insets represent the 2-D FFT power spectra. g–h Summary plots of Rq and SAR. i EDS elemental characterization. (i-1) Enlarged spectrum showing Pd Lα1 and Pd Lß1 peaks. (i-2) Summary plot of the intensity of Pd Lα1 with respect to the annealing temperature

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