Fig. 2
From: Multi-Layer SnSe Nanoflake Field-Effect Transistors with Low-Resistance Au Ohmic Contacts
a XRD pattern of SnSe single crystals, showing a clear (h00) diffraction. b EDX spectrum of the SnSe single crystals. Inset shows the detailed information of atomic ratio of Sn and Se. Insets exhibit a SEM image and EDX mapping of a SnSe nanoflake FET with a device thickness of 90 nm. c Temperature-dependent electrical conductivity of the SnSe single crystals, for temperatures ranging from 30–300 K, measured using the four-point-probe method