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Table 1 Reflectance maximum (R-max) and minimum (R-min) of the Si wafer and SiNWs in the UV, visible, and IR regions

From: Optical and Electrical Characteristics of Silicon Nanowires Prepared by Electroless Etching

Sample UV region (200–400 nm) Visible region (400–750 nm) IR region (750–1000 nm)
R-max (%) R-min (%) R-max (%) R-min (%) R-max (%) R-min (%)
Si substrate 65.1 38.8 38.8 25.5 25.5 22.1
SiNWs 19.2 3.5 15.1 12.1 12.1 9.8