Table 1 Reflectance maximum (R-max) and minimum (R-min) of the Si wafer and SiNWs in the UV, visible, and IR regions
From: Optical and Electrical Characteristics of Silicon Nanowires Prepared by Electroless Etching
Sample | UV region (200–400 nm) | Visible region (400–750 nm) | IR region (750–1000 nm) | |||
|---|---|---|---|---|---|---|
R-max (%) | R-min (%) | R-max (%) | R-min (%) | R-max (%) | R-min (%) | |
Si substrate | 65.1 | 38.8 | 38.8 | 25.5 | 25.5 | 22.1 |
SiNWs | 19.2 | 3.5 | 15.1 | 12.1 | 12.1 | 9.8 |