Fig. 3
From: Aligned Chemically Etched Silver Nanowire Monolayer as Surface-Enhanced Raman Scattering Substrates
AFM height images of as-synthesized Ag nanowires (denoted as AgNWs in figures) (a) and chemically etched Ag nanowires (denoted as E-AgNWs, the amount of etchant was 300 μL) (b), AFM cross-sectional height profiles (c), and plot of average diameter versus height difference of as-synthesized and chemically etched Ag nanowires (d)
