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Fig. 4 | Nanoscale Research Letters

Fig. 4

From: Fabrication of SrGe2 thin films on Ge (100), (110), and (111) substrates

Fig. 4

TEM characterization of the SrGe2 thin film grown on the Ge (110) substrate at 500 °C. a Bright-field TEM image. b, c Dark-field TEM images using the SrGe2 {220} plane reflection shown in each diffraction pattern. d High-resolution lattice image showing SrGe2 crystals. e SAED pattern showing the SrGe2 〈113〉 zone axis, taken from the region including SrGe2 crystals and the Ge substrate

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