Fig. 1From: TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO2 Antireflective Filmsa Low-magnification TEM images of silica sol C. b High-magnification TEM images of silica sol C. c Low-magnification TEM images of silica sol D. d High-magnification TEM images of silica sol D. Insets in images are the corresponding grain size distribution histogram and SEAD spectrumBack to article page