Fig. 2From: Direct Growth of III-Nitride Nanowire-Based Yellow Light-Emitting Diode on Amorphous Quartz Using Thin Ti Interlayera Temperature dependent PL measurement result from 77 to 300 K. b Change of peak wavelength and FWHM for temperature-dependent PL measurement. c Power-dependent μ-PL measurement performed at 77 K, indicating reduced quantum-confined Stark effectBack to article page