Fig. 2From: Thermoelectric Properties of Hot-Pressed Bi-Doped n-Type Polycrystalline SnSeFE-SEM images of the fractured surfaces along the ⊥ direction of sample SnSe:Bi 4% (a, b) and SnSe:Bi 6% (c, d). FE-SEM images showed the layered structure and the dominant layers on the plane perpendicular to the pressing directionBack to article page