Fig. 6From: Single-Walled Carbon Nanotube Dominated Micron-Wide Stripe Patterned-Based Ferroelectric Field-Effect Transistors with HfO2 Defect Control Layera Leakage current-voltage characteristics of the BNT/HfO2 and BNT film. b The fitting curve of the leakage current-voltage characteristics of the BNT/HfO2 and BNT film. c Fatigue endurance performance of the SWCNT/BNT/HfO2-FeFET, SWCNT/BNT-FeFET, and MWCNT/BNT-FeFETBack to article page