Fig. 10From: Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force MicroscopyCross-sections of the SKPFM maps (a) shown in Fig. 6. Numbers 1–7 denote cross-sections over initial and annealed samples correspondingly at 80, 100, 120, 140, 180, and 200 °C. Statistically relevant values (from histograms) of flake thickness and contact potential difference between reference Ni film and GO flake are shown in (b)Back to article page