Fig. 6From: Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force MicroscopyAFM images of drop-casted GO multiflake structures: fragment of clear GO flakes annealed at 110 °C for 15 min (a) and fragment of contaminated GO flakes annealed at 180 °C for 15 min (b). Corresponding surface height profiles along dashed lines are shown in (c)Back to article page