Table 1 Percentages of Si oxidation states by XPS measurements in Fig. 2. Obvious enhancements of various Si oxidation states can be founded from (a) to (b)
Sample | Si0 (%) | Si1+ (%) | Si2+ (%) | Si3+ (%) | Si4+ (%) |
---|---|---|---|---|---|
(a) | 41.7 | 14.7 | 4 | 23.1 | 16.5 |
(b) | 9.1 | 16.4 | 1.4 | 37.7 | 35.4 |