Table 3 PBTS testing results of CL-ES-structured device and BCE-structured device
T | Bias time | CL-ES | BCE | ||||||
|---|---|---|---|---|---|---|---|---|---|
Vg bias + 30 V | Vg bias + 30 V | ||||||||
Ion (uA) | Ioff (pA) | Vth (V) | SS (V/dec) | Ion (uA) | Ioff (pA) | Vth (V) | SS (V/dec) | ||
RT | 0 s | 8.29 | 0.10 | − 0.32 | 0.18 | 10.32 | 0.14 | 1.15 | 1.70 |
60 °C | 1000 s | 8.42 | 0.00 | 0.14 | 0.22 | 5.50 | 0.20 | 5.73 | 0.93 |
60 °C | 3600 s | 7.32 | 0.19 | 1.62 | 0.24 | 4.26 | 0.07 | 6.73 | 0.84 |
Shift (1 h–0 h) | − 0.97 | 0.09 | 1.94 | 0.06 | − 6.06 | − 0.06 | 5.58 | − 0.86 | |