Fig. 4From: Low-Cost Flexible ZnO Microwires Array Ultraviolet Photodetector Embedded in PAVL SubstrateI–V characteristic in dark and under UV illumination at different bending angles. The inset (left) shows the bending strain-induced nonmobile ionic charges at the outer (positive) and inner (negative) surfaces of the ZnO MW, and the inset (right) shows the piezo-induced electric field and piezopotential distribution at the cross-section of the bent ZnO MWBack to article page