Fig. 3
From: Switching Failure Mechanism in Zinc Peroxide-Based Programmable Metallization Cell
Typical I–V curves of (a) control, (b) ST1, (c) ST3, and (d) ST9 devices. e Cumulative probability plot of set voltage (Vset). Endurance characteristics of (f) control, (g) ST1, (h) ST3, and (i) ST9 devices. j Room temperature retention characteristics of all devices. Inset in (e) shows the coefficient of variation of the Vset distribution. Each data point in (e) represents the 25 consecutive cycles