Skip to main content
Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Switching Failure Mechanism in Zinc Peroxide-Based Programmable Metallization Cell

Fig. 3

Typical I–V curves of (a) control, (b) ST1, (c) ST3, and (d) ST9 devices. e Cumulative probability plot of set voltage (Vset). Endurance characteristics of (f) control, (g) ST1, (h) ST3, and (i) ST9 devices. j Room temperature retention characteristics of all devices. Inset in (e) shows the coefficient of variation of the Vset distribution. Each data point in (e) represents the 25 consecutive cycles

Back to article page