Fig. 7
From: RTN and Annealing Related to Stress and Temperature in FIND RRAM Array
a A comparison of histograms of normalized read current distribution of a cell in LRS state measured at 0, 25, and 50 °C. b A comparison of the cumulative probability of the |ΔI/I| of 30 samples before stress, after stress and after annealed, respectively. It is found that a large portion of the cells return to its original ΔI/I after annealing process