Fig. 8From: RTN and Annealing Related to Stress and Temperature in FIND RRAM ArrayRead currents of fresh and stressed cells sampled at 25 °C, 500 Hz compared to that of the cell after high temperature bake and cooled down in a period of 30 min to room temperature. It shows that after the bake, the stress is relieved and the cell behaves similar to a fresh oneBack to article page