Fig. 9From: RTN and Annealing Related to Stress and Temperature in FIND RRAM Arraya Normalized read currents of a 1kbit array taken at a specific time plotted at fresh, lightly stressed, highly stressed and after annealed. It could be seen that number of cells with strong fluctuation greatly increases across the array as the array undergoes more stress, and dies down after it is annealed. b Comparison of the cumulative probabilities of the |ΔI/I| distributions of 50 samples from the same array in its fresh, stressed and after annealed states, at different time instances with a 1-s interval. The overall ΔI/I on samples after stress is higher, and it returns back to normal after annealingBack to article page