Fig. 2From: Influence of Te-Doping on Catalyst-Free VS InAs NanowiresCrystal structure analysis. HR-TEM images of InAs NWs, illustrating the ZB and WZ crystal structures with and without stacking faults. The yellow arrows indicate the [111] growth direction. The colored dots and the black lines are guidance for the eyes to retrace the stacking characteristic. a FFT diffraction pattern for defect-free ZB. b, c ZB structure. d FFT diffraction pattern for defect-free WZ and e–f WZ structureBack to article page