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Fig. 1 | Nanoscale Research Letters

Fig. 1

From: Effects of Ambient Gases on the Electrical Performance of Solution-Processed C8-BTBT Thin-Film Transistors

Fig. 1

(Color online) (a) A schematic diagram of the device structure. (b) The molecular structures of the C8-BTBT, molybdenum oxide, and PMMA used in the experiment. (c) AFM surface morphology image of the C8-BTBT film indicating a small RMS value of 2.08 nm. (d) Test procedures used to measure the electrical performance characteristics of 70 units of each device type (high vacuum, nitrogen atmosphere, oxygen atmosphere, and air atmosphere)

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