Metrics
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
Last updated: Fri, 19 Apr 2024 12:42:48 UTC
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2583 Accesses
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Altmetric
- 1 tweeters
- 1 Facebook pages
- 9 news outlets
- 7 Mendeley
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This article is in the 95th percentile (ranked 15,443rd) of the 363,994 tracked articles of a similar age in all journals and the 95th percentile (ranked 1st) of the 20 tracked articles of a similar age in Discover Nano.
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