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Table 2 Structural parameters extracted from the XRR fits for the film before and after thermal annealing

From: Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

Sample Total film thickness Monolayer thickness Number of layers
DH4T (40 ± 1) nm (28.2 ± 0.1) Å 14
Annealed DH4T (39 ± 1) nm (28 ± 0.1) Å 14