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Table 2 Structural parameters extracted from the XRR fits for the film before and after thermal annealing

From: Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

Sample

Total film thickness

Monolayer thickness

Number of layers

DH4T

(40 ± 1) nm

(28.2 ± 0.1) Å

14

Annealed DH4T

(39 ± 1) nm

(28 ± 0.1) Å

14

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