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Fig. 4 | Nanoscale Research Letters

Fig. 4

From: Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell Nanowires

Fig. 4

Cross-sectional slices through the tomogram. A 3D rendered representation of the NW and a slice (upper left corner) specifies the spatial position of the − 60°-tilted slice. All slices are rotated around an axis which pierces through the NW tip and which is parallel to the [0001] NW growth axis. An inversion domain (ID) and the location of stacking faults (SF) are labeled. The slice orientations correspond to the labeling of Fig. 3. The length of the black scale bar corresponds to 50 nm

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