Fig. 2

Dark-field images of the same area on a glass substrate with TrNPs (white lines—chromium patterns for particle localization) immediately after deposition (a1) and 24 h after deposition left under the standard laboratory condition on air (b1). The white squares indicate areas of the recorded topology AFM images immediately after deposition (a2) and 24 h after deposition (b2). Zoomed 3D topology images of a single particle (indicated by squares in a2 and b2) immediately after deposition (a3) and 24 h after deposition (b3). The lines indicate the position of profile line displayed in the graph between the 3D images