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Fig. 2 | Nanoscale Research Letters

Fig. 2

From: Atomic-Scale Characterization of Slip Deformation and Nanometric Machinability of Single-Crystal 6H-SiC

Fig. 2

Schematic diagram of scratching process, where af are the corresponding process modes \( (0001)/\left[2\overline{1}\overline{1}0\right] \), \( (0001)/\left[10\overline{1}0\right] \), \( \left(01\overline{1}0\right)/\left[2\overline{1}\overline{1}0\right] \), \( \left(01\overline{1}0\right)/\left[0001\right] \), \( \left(11\overline{2}0\right)/\left[1\overline{1}00\right] \), and \( \left(11\overline{2}0\right)/\left[0001\right] \), respectively

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