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Fig. 6 | Nanoscale Research Letters

Fig. 6

From: Atomic-Scale Characterization of Slip Deformation and Nanometric Machinability of Single-Crystal 6H-SiC

Fig. 6

The cross-section of machined area, D is dislocation, A is amorphous phase, SCF is single-crystal form, O is other type of defect, where af are the corresponding process modes \( (0001)/\left[2\overline{1}\overline{1}0\right] \), \( (0001)/\left[10\overline{1}0\right] \), \( \left(01\overline{1}0\right)/\left[2\overline{1}\overline{1}0\right] \), \( \left(01\overline{1}0\right)/\left[0001\right] \), \( \left(11\overline{2}0\right)/\left[1\overline{1}00\right] \), and \( \left(11\overline{2}0\right)/\left[0001\right] \), respectively.

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