Fig. 2From: Local VOC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si NanowiresI-V curves obtained on a SiNW RJ device under dark conditions (black circles), with the 1310-nm laser beam of the TRIOS AFM (blue solid line) and with the 690-nm laser beam of the Enviroscope AFM (red dashed line). The principal graph illustrates the log |I|-V curves in the range − 1 V and + 1 V, and the insert graph represents an enlargement of the linear I-V curves between − 5 mV and + 5 mVBack to article page