Fig. 3From: Local VOC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowiresa Macroscopic I-V curves measured under different power illuminations (66, 5, 149, 268, and 555 μW at 488 nm); b from left to right: topography, CPD under dark conditions, and CPD under illumination (270 μW at 488 nm), respectivelyBack to article page