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Table 4 The comparison of the Idark, rise time (τr) and decay time (τd) of solar-blind photodetectors based on β-, α-, and ε-Ga2O3 thin films synthesized by different techniques

From: Effects of Post Annealing on Electrical Performance of Polycrystalline Ga2O3 Photodetector on Sapphire

Material

Method

Idark (nA)

Rise time τr (s)

Decay time τd (s)

Ref.

Poly-Ga2O3

RFMS

0.0033 (5 V)

0.148/0.672

0.067/0.634

This work

β-Ga2O3

RFMS

0.11 (10 V)

0.31/1.52

0.05/0.91

[30]

β-Ga2O3

Laser MBE

80 (10 V)

0.86

1.02/16.61

[6]

β-Ga2O3

MBE

4 (20 V)

3.33

0.4

[31]

β-Ga2O3

PLD

430 (20 V)

0.87/10.81

0.54/13.98

[2]

β-Ga2O3

MOCVD

34 (10 V)

0.48

0.18

[32]

β-Ga2O3

Sol-gel

0.758 (30 V)

0.1/0.18

0.1/1.85

[26]

α-Ga2O3

MOCVD

8.1×10−5 (12 V)

Not given

0.042

[33]

ε-Ga2O3

MOCVD

0.037 (200 V)

2.5

0.4/2.6

[34]

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