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Fig. 1 | Nanoscale Research Letters

Fig. 1

From: Atomic-Resolution EDX, HAADF, and EELS Study of GaAs1-xBix Alloys

Fig. 1

a Cross-sectional HAADF image of sample S1 GaAs-GaAsBi interface area. A zoomed-in inset of the interface is shown on the bottom right. Crystallographic directions are the same as in Fig. 1b. b HAADF image of the sample away from the interface. An elongated spontaneously phase-separated GaAs-like domain is seen in the middle. Inset shows the Fourier transform of the image. c An image formed from (b) using the 1/2[\( \overline{1} \)11]* pair of superlattice reflections. Brighter colors indicate more pronounced ordering. d An image formed from (b) using the pair of ½[1\( \overline{1} \)1]*reflections

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