Fig. 2
From: Skyrmion Phase in MnSi Thin Films Grown on Sapphire by a Conventional Sputtering
Morphological and structural characterization of MnSi film grown on Al2O3 substrate. a SEM image of the as-grown MnSi film. b AFM topographic image corresponding to a. RMS roughness is estimated to be under 1 nm. c Representative HR-TEM image of MnSi film grown on sapphire. Inset: FFT from selected area of MnSi in the HR-TEM image. d Elemental mapping of EDS of the cross-sectional MnSi film