Fig. 2From: Effect of Ag Concentration Dispersed in HfOx Thin Films on Threshold SwitchingElectrical properties of the fabricated devices. a I-V curve of D1 (highly insulating state). b I-V curve of D2, showing the EF process and subsequent TS behaviors. c I-V curve of D3, showing TS behavior without the EF process. d I-V curve of D4 (conducting state)Back to article page