Fig. 4From: Effect of Ag Concentration Dispersed in HfOx Thin Films on Threshold SwitchingMicrostructural and compositional analysis. a TEM cross-sectional image of D2. b Enlarged TEM image of D2. The inset is the corresponding FFT image. c TEM cross-sectional image of D3. d Enlarged TEM image of D3. The inset is the corresponding FFT image. EDS elemental line profiles of e D2 and f D3Back to article page