Fig. 7From: Investigating Size-Dependent Conductive Properties on Individual Si Nanowires∆Φ ~ V curves measured by EFM on individual Si NWs with a different diameters of 190, 260, and 350 nm (length = 350 nm) and b different lengths of 350, 600, 800, and 960 nm (diameter = 190 nm). c and d present the VCPD values obtained by curve fitting as a function of NWs’ diameter and length. The curves in a and b are vertically shifted for guidanceBack to article page