Fig. 1From: Photoelectronic Properties of End-bonded InAsSb Nanowire Array Detector under Weak LightAdvanced electron microscopy investigations on InAsSb NWs. a A tilted-view SEM image of the NWs. b Bright-field (BF)TEM image of an individual NW. c High-resolution TEM (HRTEM) image taken from the middle of the NW from the marked region in b. d Corresponding SAED (selected area electron diffraction) pattern taken from cBack to article page