Fig. 5From: Photoelectrical Properties Investigated on Individual Si Nanowires and Their Size DependenceThe topography image of Si NWs (a), the phase shift images obtained at different laser intensities of 0 (b), 4 (c) and 10 W/cm2 (d), respectively. e The phase shift image acquired in line scan mode on the top center of nanowire. The averaged phase shift over the scan line along the marked red curve in e is plotted in fBack to article page