Fig. 6From: Photoelectrical Properties Investigated on Individual Si Nanowires and Their Size Dependencea ∆Φ ~ VEFM curves measured by EFM on individual Si NWs with the diameter of 190 nm and length of 800 nm under different laser irradiation. b The results of Qs and VCPD obtained by fitting the curves in a as a function of laser intensity. The diameter and length dependence of VCPD at the laser intensity of 8 W/cm2 is presented in c, d, respectivelyBack to article page