Fig. 2From: Fabrication of Rectification Nanosensors by Direct Current Dielectrophoresis Alignment of ZnO Nanowiresa Top-view and b cross-sectional SEM images of ZnO NWs arrays fabricated by DC-DEP method. c TEM image of ZnO NW. d Atomic resolution TEM image of ZnO NW corresponds to the red square in c. The inset is the SAD patterns of ZnO NWBack to article page