Fig. 5

a Schematic of CVD growth of semiconductor/semiconductor lateral 2D heterostructures. b Atomic resolution contrast STEM images of in-plane interface between WS₂ and MoS₂. c The Raman intensity mapping of 2D heterostructured 2D film at 351 cm⁻¹ (yellow) and 381 cm⁻¹ (purple). d The combined PL intensity mapping at 630 nm (orange) and 680 nm (green). Reprinted and reproduced with permission from [89]