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Fig.15 | Nanoscale Research Letters

Fig.15

From: The Design of the Emission Layer for Electron Multipliers

Fig.15

Schematic diagram of XPS test experiment sample, a shows the information of MgO/Al2O3 (on the silicon wafer, grow 35 nm-MgO, and then grow 0.3 nm-Al2O3), b shows the information of deliquescent MgO/Al2O3 (on the silicon wafer, grow 35 nm-MgO, and then grow 0.3 nm-Al2O3), c shows the information of deliquescent MgO (on the silicon wafer, grow 11 nm-MgO), d shows the information of deliquescent MgO/Al2O3 (on the silicon wafer, grow 35 nm-MgO, and then grow 1 nm-Al2O3)

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