Fig.15

Schematic diagram of XPS test experiment sample, a shows the information of MgO/Al₂O₃ (on the silicon wafer, grow 35 nm-MgO, and then grow 0.3 nm-Al₂O₃), b shows the information of deliquescent MgO/Al₂O₃ (on the silicon wafer, grow 35 nm-MgO, and then grow 0.3 nm-Al₂O₃), c shows the information of deliquescent MgO (on the silicon wafer, grow 11 nm-MgO), d shows the information of deliquescent MgO/Al₂O₃ (on the silicon wafer, grow 35 nm-MgO, and then grow 1 nm-Al₂O₃)