Table 1 Incident electron energy partition of different materials, and the empirical formula for the best SEE and thickness of the material
From: The Design of the Emission Layer for Electron Multipliers
Incident electron energy partition | Al2O3 (eV) | MgO (eV) | Al2O3/MgO (eV) | MgO/Al2O3 (eV) |
---|---|---|---|---|
Low | [0, 250] | [0, 500] | [0, 500] | [0, 300] |
Medium | [250, 500] | [500, 1000] | [500, 1000] | [500, 1000] |
High | [500, 1500] | [1000, 1500] | [1000, 1500] | [500, 1500] |
Best SEE formula | 3.99 − 205 * ethickness/1.73 | 9.56 – 8.64 * ethickness/7.39 | 7.94 – 1.21 * ethickness/1.03 | 4.69 + 3.64 * ethickness/2.11 |